MIL-M-38510-59 Microcircuits, Digital, Cmos, Decoder, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, CMOS logic microcircuits. Two product assurance classes and a choice of case outlines , lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/59D

TABLE V. Radiation hardened end-point electrical parameters at 25°C.

Parameter

Test limits

(All device types)

VDD

Device types

VTN

VTP

�VT

ISS

tPLH

tPHL

0.3 V min

2.8 V max

1.4 V max

100 x max limit

1.35 x max limit

10 V

15 V

5 V

10 V

18 V

5 V

TABLE VI. Bias during exposure to radiation.

Device type	Pin connections 1/
Device type	VDD = 10 V dc (through a 30 kn to 60 kn resistor)	VSS = GND	VDD = 10 V dc
01	10, 11, 12, 13	8	16
51	10, 11, 12, 13	8	16

1/ Pins not designated are open or tied to 10 V dc through a 30 kn to 60 kn resistor.

FIGURE 5. Threshold-voltage test circuit.

TABLE VII. Threshold-voltage test circuit conditions.