TABLE III. Group A inspection for device type 52 - Continued.
Symbol |
MIL- STD- 883 method |
Cases A, C,D,T,X, y |
Terminal conditions 1/ |
Measured terminal |
Test limits |
Unit |
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1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
Subgroup 9 TC = 25°C |
Subgroup 10 TC = 125°C |
Subgroup 11 TC = -55°C |
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Test no. |
IA |
OA |
OB |
IB |
CB |
CC |
VSS |
IC |
OC |
OD |
ID |
CD |
CA |
VDD |
Min |
Max |
Min |
Max |
Min |
Max |
||||
tPLH |
3003 Fig. 3 " " |
140 141 142 143 |
IN |
OUT |
OUT |
IN |
GND 5.0V GND " |
GND " 5.0V GND |
GND " " " |
IN |
OUT |
OUT |
IN |
GND " " 5.0V |
5.0V GND " " |
5.0V " " " |
IA to OA IB to OB IC to OC ID to OD |
4 " " " |
70 " " " |
7 " " " |
85 " " " |
4 " " " |
70 " " " |
ns " " " |
tPHL |
" " " " |
144 145 146 147 |
IN |
OUT |
OUT |
IN |
GND 5.0V GND " |
GND " 5.0V GND |
GND " " " |
IN |
OUT |
OUT |
IN |
GND " " 5.0V |
5.0V GND " " |
" " " " |
IA to OA IB to OB IC to OC ID to OD |
" " " " |
60 " " " |
" " " " |
80 " " " |
" " " " |
50 " " " |
" " " " |
tPHZ |
Fig. 4 " " " |
148 149 150 151 |
5.0V |
OUT |
OUT |
5.0V |
" IN GND " |
" " IN GND |
" " " " |
5.0V |
OUT |
OUT |
5.0V |
GND " " IN |
IN GND " " |
" " " " |
CA to OA CB to OB CC to OC CD to OD |
" " " " |
70 " " " |
" " " " |
90 " " " |
" " " " |
55 " " " |
" " " " |
tPZH |
Fig. 4 " " " |
152 153 154 155 |
5.0V |
OUT |
OUT |
5.0V |
" IN GND " |
" " IN GND |
" " " " |
5.0V |
OUT |
OUT |
5.0V |
GND " " IN |
IN GND " " |
" " " " |
CA to OA CB to OB CC to OC CD to OD |
" " " " |
" " " " |
" " " " |
" " " " |
" " " " |
" " " " |
" " " " |
tPLZ |
Fig. 4 " " " |
156 157 158 159 |
GND |
OUT |
OUT |
GND |
" IN GND " |
" " IN GND |
" " " " |
GND |
OUT |
OUT |
GND |
GND " " IN |
IN GND " " |
" " " " |
CA to OA CB to OB CC to OC CD to OD |
" " " " |
" " " " |
" " " " |
" " " " |
" " " " |
" " " " |
" " " " |
tPZL |
Fig. 4 " " " |
160 161 162 163 |
GND |
OUT |
OUT |
GND |
" IN GND " |
" " IN GND |
" " " " |
GND |
OUT |
OUT |
GND |
GND " " IN |
IN GND " " |
" " " " |
CA to OA CB to OB CC to OC CD to OD |
" " " " |
" " " " |
" " " " |
" " " " |
" " " " |
" " " " |
" " " " |
1/ Pins not designated may be "High" level logic, "Low" level logic, or open. Exceptions are as follows: VIC(pos) tests, the VSS terminal shall be open; VIC(neg) tests, the VDD terminal shall be open.
2/ ISS measurements shall be run in sequence.
3/ When performing quiescent current measurements (ISS), the meter shall be placed so that all currents flow through the meter. The outputs
during the ISS measurement shall be open.
4/ The device manufacturer may, at his option, measure IIL and IIH at 25°C for each individual input or measure all inputs together.
5/ See figure 5.
6/ See figure 6.
7/ See figure 7.
8/ See figure 8.
9/ Cc and Cis - connect capacitance bridge between measured input terminal and VSS, frequency = 1 MHz.
10/ Cos - connect capacitance bridge between measured output terminal and VSS, frequency = 1 MHz.
11/ Cios - connect capacitance bridge between measured input and output terminals, frequency = 1 MHz.
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