MIL-M-38510-504 Microcircuits, Digital, Bipolar Programmable Logic, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, bipolar, programmable logic microcircuits which employ titanium tungsten TiW resistors as the fusible link or programming element. Two product assurance classes and a choice of case outlines and lead materials and finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4.

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MIL-M-38510/5048

IOZL:

a. GND on pins 2-11, and a clock pulse on pin 1. Outputs are on pins 12 and 19 for device types 01 and

07.

b. GND on pins 2-10, 2.0 V on pin 11, and a clock pulse on pin 1. Outputs are on pins 12-19 for device types 02 and 08. Outputs are on pins 13-18 for device types 03 and 09. Outputs are on pins 14-17 for device types 04 and 10.

IOS:

Applying the proper output test, generate the output condition as specified for VOH. Short only one output at a time. Duration of the short should not exceed 1 second.

2/ The functional tests shall verify that no fuses are blown for unprogrammed devices, or that the altered item drawing pattern exists for programmed devices, VIH = 3.0 V, VIL = GND.

3/ The test shall check all inputs, gates, and outputs that have been programmed. The test shall be performed

VCC = 4.5 V and 5.5 V.

4/ The outputs are loaded per figure 5.

5/ The maximum clock frequency (fMAX) is considered met if the proper output state changes occur with the frequency set to the minimum limit given in table III, or fMAX = 1 / (tSU + tP (CL)).

6/ External output enable set (OE = GND).

7/ External output enable reset (OE = 3.0 V).

8/ Synchronous registered output, with external output enable (pin 11).

9/ Asynchronous output, with internal output enable.

10/ tSU and tP(CL) may be tested concurrently with tPCL and tPCH by using values within the maximum test values of table III.

11/ For circuit C, IOS test may be replaced with an equivalent IO test as follows: pins 12-19, delete "GND and substitute "2.25 V"; pin 20 VCC, delete "5.0 V", substitute "5.5 V"; and in the limits columns, delete min/max of "-30/-

250" and substitute "-15/-125".