MIL-M-38510/5048
NOTES:
1. Test table for devices programmed in accordance with an altered item drawing may be replaced by the equivalent test which apply to the specific program configuration for the resulting PAL.
2. CL = 50 pF minimum, including jig and probe capacitance; R1 = 365 n ± 2 %; R2 =
115 n ± 2 %.
3. Outputs may be under load simultaneously.
4. Verification of limit conditions tP (CL), tSU, and th = 0 ns may be conducted by simultaneously setting the condition to the specified limit values of table III and observing for proper output state change.
FIGURE 5. Switching time test circuit and waveforms - Continued.
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