MIL-M-38510/504B
4.4 Technology Conformance Inspection (TCI). Technology conformance inspection shall be in accordance with
MIL-PRF-38535.
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows:
a. Tests shall be as specified in table II.
b. Subgroups 4, 5, and 6 shall be omitted.
c. For unprogrammed devices, a sample shall be selected to satisfy programmability requirements. Twelve devices shall be submitted to programming (see 3.3.2.1). If more than 2 devices fail to program, the lot shall be rejected. At the manufacturers option, the sample may be increased to 24 total devices with no more than
4 total device failures allowable.
d. For unprogrammed devices, 10 devices from the programmability sample shall be submitted to the requirements of the specified tests of subgroups 1, 2, 3 designated for programmed devices only. If any device fails, the lot shall be rejected.
e. For unprogrammed devices, 10 devices from the programmability sample shall be submitted to the requirements of group A, subgroups 9, 10, 11. If more than two total devices fail the lot shall be rejected. At the manufacturers option, the sample may be increased to 20 total devices with no more than 4 total device failures allowable.
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535. a. Electrical parameters shall be as specified in table II herein.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows:
a. End-point electrical parameters shall be as specified in table II.
b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883.
c. For qualification, at least 50 percent of the sample selected for testing in subgroup 1 shall be programmed (see 3.2.2). For quality conformance inspection, the programmability sample (see 4.4.1c) shall be included in the life tests.
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535 and as follows. End-point electrical test parameters shall be as specified in table II.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows:
4.5.1 Voltage and current. All voltages given are referenced to the microcircuit ground terminal. Currents given are conventional current and positive when flowing into the referenced terminal.
4.6 Programming / verifying procedure for circuit A, B, and C. The programming specifications on figure 6a, figure 7 and table IV for circuit A; figure 6b, figure 7, and table V for circuit B; and figure 6c, figure 7 and table VI for circuit C, and the following procedures shall be used for programming the device.
4.6.1 Pre-verification.
a. Raise VCC to 5.0 V.
b. Raise output disable pin, OD, to VIHH.
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