MIL-M-38510-371 Microcircuits, Digital, Bipolar, Advanced, Low-Power Schottky Ttl, Flip-Flops, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, advanced, low-power Schottky TTL, flip flops, bistable logic microcircuits. Two product assurance classes and a choice of case outlines/lead finish are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13 - 14 - 15 - 16 - 17 - 18 - 19 - 20 - 21 - 22 - 23 - 24 - 25 - 26 - 27 - 28 - 29 - 30 - 31 - 32 - 33 - 34 - 35 - 36 - 37 - 38 - 39 - 40 - 41 - 42 - 43 - 44 - 45 - 46 - 47 - 48 - 49 - 50 - 51 - 52 - 53 - 54 - 55 - 56 - 57 - 58 - 59 - 60 - 61 - 62 - 63 - 64 - 65 - 66 - 67 - 68 - 69 - 70 - 71 - 72 - 73 - 74 - 75 - 76 - 77 - 78 - 79 - 80 - 81 - 82 - 83 - 84 - 85 - 86 - 87 - 88

MIL-M-38510/371B

TABLE I. Electrical performance characteristics.

Test	Symbol	Conditions -55°C < TC < +125°C unless otherwise specified	Device types	Limits		Unit
				Min	Max
Propagation delay time output control to high level output	tPZH	VCC = 5.0 V CL = 50 pF ±10% RL = 500ν	04, 05, 06, 07	4	21	ns
Propagation delay time low level to output control	tPLZ		05, 06, 07	3	15
			04	2	15
Propagation delay time high level to output control	tPHZ		05, 06, 07	2	10
			04	2	12

1/ The output conditions have veen chosen to produce a current that closely approximates one-half of the true short-circuit output current, IOS.

2/ ICC is measured with outputs open with J, K, K , or D, CLK and PR grounded; then with J, K, K , or D, CLK and CLR grounded.