TABLE III. Group A inspection for device type 02, 04.
Terminal conditions Outputs: Not designated are open or resistive coupled to GND or voltage .
Inputs: Not designated are high � 2.0 V, low s 0.8 V, or open.
1 2
1/ For programmed devices, select an appropriate address to acquire the desired output state, VIL = 0.8 V, VIH = 2.0 V.
2/ 16 mA for circuits A, C and G.
12 mA for circuit B.
3/ For unprogrammed devices, apply 12.0 V on pin 6 (A1) for circuit B devices.
4/ For unprogrammed devices, apply 13 V on pins 1 (A6) and 2 (A5) for circuit A devices.
5/ The functional tests shall verify that no fuses are blown for unprogrammed devices or that the truth table specified in the altered item drawing exists for
programmed devices (see 3.3.2). All bits shall be tested. Terminal conditions shall be as follows:
a. Inputs: H = 3.0 V, L = GND
b. Outputs: Output voltage shall be either:
1. H = 2.4 V minimum and L = 0.5 V maximum when using a high speed checker double comparator, or
2. H � 1.0 V and L s 1.0 V when using a high speed checker single comparator. c. The functional tests shall be performed with VCC = 4.5 V and VCC = 5.5 V.
6/ For unprogrammed 02 devices (82S129); apply 10.0 V on pin 15 (A7), apply 0.5 V on pin 2 (A5) and 5.0 V on all other address lines for circuit C devices. For unprogrammed 04 devices (82S129A) apply 10.0 V on pin 5 (A0) and 5.0 V on all other address pins for the circuit C devices.
7/ 2.4 V for circuit B devices.
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