MIL-M-38510/203E
TABLE I. Electrical performance characteristics.
Characteristic |
Symbol |
Conditions 1/ -55°C ≤ TC ≤ +125°C |
Device type |
Limits |
Unit |
|
Min |
Max |
|||||
High level output voltage |
VOH |
VCC = 4.5 V; IOH = -2 mA, VIL = 0.8 V, VIH = 2.0 V |
02,04 |
2.4 |
--- |
V |
Low level output voltage |
VOL |
VCC = 4.5 V; IOL = 16 mA 2/ VIL = 0.8 V, VIH = 2.0 V |
01,02 03,04 |
--- |
0.5 |
V |
Input clamp voltage |
VIC |
VCC = 4.5 V; IIN = -10 mA; TC = 25°C |
01,02 03,04 |
--- |
-1.5 |
V |
Maximum collector cut-off current |
ICEX |
VCC = 5.5 V; VO = 5.2 V |
01,03 |
--- |
100 |
µA |
High impedance (off-state) output high current |
IOHZ |
VCC = 5.5 V; VO = 5.2 V |
02,04 |
--- |
100 |
µA |
High impedance (off-state) output low current |
IOLZ |
VCC = 5.5 V; VO = .5 V |
02,04 |
--- |
-100 |
µA |
High level input current |
IIH1 |
VCC = 5.5 V; VIN = 5.5 V |
01,02 03,04 |
--- |
50 |
µA |
High level input current |
IIH2 |
VCC = 5.5 V; VIN = 4.5 V; special program pin |
01,02 03,04 |
--- |
100 |
µA |
Low level input current |
IIL |
VCC = 5.5 V; VIN = 0.5 V |
01,02 03,04 |
-1 |
-250 |
µA |
Short circuit output current |
IOS |
VCC = 5.5 V; 3/ VO = 0.0 V |
02,04 |
-10 |
-100 |
mA |
Supply current |
ICC |
VCC = 5.5 V; VIN = 0; outputs open |
01,02 03,04 |
--- |
130 |
mA |
Propagation delay time high-to-low level logic, address to output |
tPHL1 |
VCC = 4.5 V and 5.5 V; CL = 30 pF minimum; see figure 5 |
01, 02 |
--- |
75 |
ns |
03, 04 |
--- |
35 |
||||
Propagation delay time low-to-high level logic, address to output |
tPLH1 |
01, 02 |
--- |
75 |
ns |
|
03, 04 |
--- |
35 |
||||
Propagation delay time high-to-low level logic, enable to output |
tPHL2 |
01, 02 |
--- |
35 |
ns |
|
03, 04 |
--- |
20 |
||||
Propagation delay time low-to-high level logic, enable to output |
tPLH2 |
01, 02 |
--- |
35 |
ns |
|
03, 04 |
--- |
20 |
1/ Complete terminal conditions shall be specified in table III.
2/ IOL = 12 mA for circuit B.
3/ Not more than one output shall be grounded at one time. Output shall be at high logic level prior to test.
4
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