MIL-M-38510-174 Microcircuits, Digital, CMOS, Inverter, NAND Buffer Driver, Strobed Hex Inverter/Buffer, Voltage Level Shifter, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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TABLE III.  Group A inspection for device type 04 - Continued.

1/  Pins not designated may be "HIGH" level logic, "LOW" level logic or open.  Exceptions are as follows:  VIC(pos)  tests, the VSS  terminals shall be open; VIC(neg)  tests, the VDD  terminal shall be open; ISS  tests, the output terminals shall be open.

2/  The ISS  measurements shall be performed in sequence.

3/  The device manufacturer may, at his option, measure IIL, IIH, IOC11, and IOC21  at 25°C for each individual input or measure all inputs together.

4/  See 4.4.1c.

5/  Measured with external pull-up resistor of 1.0 kν ±5% connected between the output and VDD  for tPLZ  and tPZL; and VSS  for tPHZ  and tPZH.

6/  For device type 02, during the transition and propagation measurements, the output shall use an external pull-up resistor of 120ν connected between the output and VDD.