MIL-M-38510-124 Microcircuits, Linear, Precision Voltage References, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, precision voltage references. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3

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MIL-M-38510/1240

TABLE I. Electrical performance characteristics - Continued.

1/ Output voltage temperature coefficient is defined as the absolute difference between the output voltage at

TA = +125°C and the output voltage at TA = -55°C divided by the product of the absolute temperature range and the output voltage multiplied by one million, example:

VOUT1 / T = [ ( VO (+25°C) - VO (-55°C) ) / ((+80°C) 10 V) ] x 106

VOUT2 / T = [ ( VO (+125°C) - VO (+25°C) ) / ((+100°C) 10 V) ] x 6

2/ Long term drift specification applies only to device under continuous power.

3/ Reference voltage is measured immediately after device is turned ON. Changes due to chip warm up are typically less than 0.005 percent

4/ Line, load, and shunt mode regulation are measured on a pulse basis. Pulse is not to exceed 30 ms.

5/ RMS noise is measured with a two pole high pass filter at 10 Hz and a two pole low pass filter at 1kHz.

6/ Shunt voltage is measured with the input open. With the input connected, the shunt mode current can be reduced to 0 mA. Load regulation will remain the same.

3.6 Electrical test requirements. The electrical test requirements for each device class shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table III.

3.7 Marking. Marking shall be in accordance with MIL-PRF-38535.

3.7.1 Serialization. All class S devices shall be serialized in accordance with MIL-PRF-38535.

3.7.2 Correctness of indexing and markings. All devices shall be subjected to the final electrical tests specified in table II after part marking to verify that they are correctly indexed and identified by part number. Optionally, an approved electrical test may be devised especially for this requirement.

3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number 59 (see MIL-PRF-38535, appendix A).