MIL-M-38510-119 Microcircuits, Linear, Low Power, Low Noise, Bi-Fet Operational Amplifiers, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, BI-FET operational amplifiers. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

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MIL-M-38510/119B

TABLE IV. Group C end-point electrical parameters. 1/

Table III tests		Limits		Units
		Min	Max
VIO	Limit	-5	5	mV
	Delta	-1	1
+IIB	Limit	-200	200	pA
	Delta	-100	100
-IIB	Limit	-200	200	pA
	Delta	-100	100

1/ TA = +25°C, ±VCC = ±15 V for all device types.

4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with MIL-PRF-

38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).

4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows:

a. Tests shall be as specified in table II herein. b. Subgroups 9, 10, and 11 shall be omitted.

c. Subgroup 12 shall be added to group A inspection as shown in table III herein. The sample size series number shall be 5 for all classes (accept on 0).

4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535.

4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows:

a. End point electrical parameters shall be as specified in table II herein.

b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883.

4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End point electrical parameters shall be as specified in table II herein.

4.5 Methods of inspection. Methods of inspection shall be specified and as follows.

4.5.1 Voltage and current. All voltage values given are referenced to the microcircuit ground terminal of the device under test

(DUT). Current values given are conventional current and are positive when flowing into the referenced terminal.