TABLE III. Group A inspection for all device types - Continued.
Subgroup |
Symbol |
MIL-STD- 883 method |
Test No. |
Notes |
Adapter pin numbers |
Energized relays |
Measured pin |
Equation 1/ |
Device types |
Limits |
Unit |
||||||
1 |
2 |
3 |
4 |
No. |
Value |
Unit |
Min |
Max |
|||||||||
8 TA = -55°C |
TR(tr) |
---- |
96 |
FIG 4 |
15 V |
-15 V |
50 mV |
OPEN |
NONE |
6 |
�t3 |
ns |
TR(tr) = �t3 |
01, 02, 03 |
400 |
ns |
|
04, 05, 06 |
200 |
||||||||||||||||
TR(os) |
---- |
97 |
FIG 4 |
15 V |
-15 V |
50 mV |
OPEN |
NONE |
6 |
VO3, �VO3 |
mV |
TR(os) = 100 �VO3 VO3 |
01, 02, 03 |
20 |
% |
||
04, 05, 06 |
40 |
||||||||||||||||
SR(+) |
4002 |
98 |
FIG 4 |
15 V |
-15 V |
12/ |
OPEN |
NONE |
6 |
�VO3 (+) |
V |
SR(+) = �VO3(+) �t3(+) |
01, 02, 03 |
0.7 |
V/µs |
||
�t3 (+) |
µs |
04, 05, 06 |
5 |
||||||||||||||
SR(-) |
4002 |
99 |
FIG 4 |
15 V |
-15 V |
12/ |
OPEN |
NONE |
6 |
�VO3 (-) |
V |
SR(-) = ∆VO3(-) ∆t3(-) |
01, 02, 03 |
0.7 |
V/µs |
||
�t3 (-) |
µs |
04, 05, 06 |
5 |
||||||||||||||
12 TA = +25°C |
ts(+) |
4002 |
100 |
FIG 5 |
15 V |
-15 V |
10 V |
OPEN |
NONE |
5 |
ts(+) |
ns |
See FIGURE 5 |
01, 02, 03 |
6,000 |
ns |
|
ts(-) |
101 |
FIG 5 |
15 V |
-15 V |
-10 V |
OPEN |
NONE |
5 |
ts(-) |
ns |
See FIGURE 5. |
04, 05, 06 |
1,500 |
ns |
|||
1/ The equations take into account both the closed loop gain of 1,000 and the scale factor multiplier so that the calculated value is in table I units.
The measured value units should, therefore, be used in the equation. (For example: If E1 = 2 V and VIO = E1, then VIO = 2 mV.)
For devices marked with the "Q" certification mark, the parameters listed herein may be guaranteed if not tested to the limits specified in accordance
with the manufacturer's QM plan
2/ Each device shall be tested over the common mode range as specified in table III. VCM conditions are achieved by grounding the inputs and algebraically subtracting VCM from each supply. (For example: If VCM = -11 V, then +VCC = +15 V - (-11) = +26 V and -VCC = -15 V - (-11) = -4 V).
3/ Input offset current, IIO, may be measured directly. To do so, both K1 and K2 shall be energized. The difference in E values, with and without the relays energized, is multiplied by the proper coefficient to yield the IIO value.
4/ Common mode rejection is calculated using the offset voltage values measured at the common mode range end points.
5/ VIO ADJ (±) is only tested on device types 01 and 04 certain duals in a 14 pin dual-in-line package.
6/ The output shall be shorted to ground for 25 ms, or less.
7/ For device types 02, 03, 05, and 06 maximum limit shown is for 1 operating ampere only, this value is double for the dual device
(for example: 2 x 3.5 = 7 mA at +25°C and +125°C; for example: 2 x 4.0 = 8 mA at -55°C), quadruple for the quad devices.
8/ Tests 24 and 44 which require a read and record measurement plus a calculation may be omitted except when subgroups 2 and 3 are being accomplished
for group A sampling inspection and groups C and D end-point measurements.
9/ To minimize thermal drift, the reference voltage for the gain measurement (E3, E17, and E33) shall be taken immediately prior to or after the reading corresponding to device gain (E41, E42, E45, E46, E49, and E50).
10/ Broadband noise NI(BB) shall be measured using an RMS voltmeter with a bandwidth of 10 Hz to 15 kHz. "Popcorn" noise NI(PC) shall be measured for
15 seconds.
11/ Quad devices 03 and 06 shall be tested for all combinations of channel separation (for example: tests 80 through 91). Dual devices are tested for two combinations of channel separation (for example: tests 80 and 83).
12/ All device types are tested with a -5 V to +5 V step input as shown on figure 4. The circuit gain is 1 V/V.
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