MIL-M-38510-765 Microcircuits, Digital, Advanced Cmos, Shift Registers, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, advanced CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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Test

Symbol

Test conditions, unless otherwise

specified 1/

Device type

2/

VCC

Group A

subgroups

(test method)

-55°C/+25°C

limits

+125°C

limits

Unit

Min

Max

Min

3/

Max

3/

Latch-up input/

output over-

voltage

11/

ICC

(O/V2)

tw � 100 µs

tcool  � tw

5 µs ≤ tr  ≤ 5 ms

5 µs ≤ tf  ≤ 5 ms

Vtest = 6.0 V

VCCQ  = 5.5 V

Vover  = 9.0 V

All

5.5 V

2

100

mA

Truth table test

12/

VIL  = .45 V VIH  = 2.5 V Verify output VO

M,D,P, L,R

5/

06

3.0 V

7 (3014)

L

H

VIL  = .6 V VIH  = 3.7 V Verify output VO

All

4.5 V

7,8 (3014)

L

H

L

H

Maximum CLK

frequency

fMAX

CL  = 50 pF RL = 5000

See 4.4.1f

All

3.0 V

9,10,11

90

70

MHz

4.5 V

130

80

Propagation delay time,

CLK to I/On

tPHL1, tPLH1

CL  = 50 pF RL  = 5000

All

3.0 V

9,10,11 (3003)

1.0

23.0

1.0

26.5

ns

See figure 3

13/ 14/

M,D,P, L,R

5/

06

9 (3003)

1.0

23.0

CL  = 50 pF RL  = 5000

All

4.5 V

9,10,11

(3003)

1.0

16.0

1.0

18.5

ns

See figure 3

13/ 14/

M,D,P, L,R

5/

06

9 (3003)

1.0

16.0

Propagation

delay time, CLK to Q0, CLK to Q7

tPHL2, tPLH2

CL  = 50 pF RL = 5000

All

3.0 V

9,10,11

(3003)

1.0

21.5

1.0

26.5

ns

See figure 3

13/ 14/

M,D,P,

L,R

5/

06

9

(3003)

1.0

21.5

CL  = 50 pF RL  = 5000

All

4.5 V

9,10,11 (3003)

1.0

14.5

1.0

18.0

ns

See figure 3

13/ 14/

M,D,P,

L,R

5/

06

9

(3003)

1.0

14.5