MIL-M-38510-765 Microcircuits, Digital, Advanced Cmos, Shift Registers, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, advanced CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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Test

Symbol

Test conditions,

unless otherwise specified 1/

Device

type

2/

VCC

Group A

subgroups (test method)

-55°C/+25°C

limits

+125°C

limits

Unit

Min

Max

Min

3/

Max

3/

Supply

current quiescent

ICC

7/

VIN  = VCC  or

GND

All

5.5 V

1,2

(3005)

2

10

µA

M  5/

06

1 (3005)

25

D  5/

200

P, L, R

5/

700

Three-state

output leakage current low

IOZL

7/

VOUT  = GND

All

5.5 V

1,2,3

(3005)

-0.6

-11.0

µA

8/

M,D,P, L,R

5/

06

1 (3005)

-25

Three-state

output leakage current high

IOZH

7/

VOUT  = VCC

All

5.5 V

1,2,3

(3005)

+0.6

+11.0

µA

8/

M,D,P,

L,R

5/

06

1

(3005)

+25

Input/output capacitance

CI/O

See 4.4.1c

TC = 25°C 9/

All

5.5 V

4 (3012)

15

pF

Input

capacitance

CIN

See 4.4.1c

TC = 25°C

All

GND

4

(3012)

10

Power

dissipation capacitance

CPD

See 4.4.1c

TC = 25°C

10/

All

4

250

Latch-up

input/ output over- voltage

11/

ICC

(O/V1)

tw � 100 µs

tcool  � tw

5 µs : tr  : 5 ms

5 µs : tf  : 5 ms Vtest = 6.0 V VCCQ  = 5.5 V

Vover  = 10.5 V

All

5.5 V

2

200

mA

Latch-up input/

output positive

over- current

11/

ICC

(O/I1+)

tw � 100 µs

tcool  � tw

5 µs : tr  : 5 ms

5 µs : tf  : 5 ms

Vtest = 6.0 V

VCCQ  = 5.5 V

Itrigger  = +120 mA

All

5.5 V

2

200

mA

Latch-up input/

output negative

over- current

11/

ICC

(O/I1-)

tw � 100 µs tcool  � tw

5 µs : tr  : 5 ms

5 µs : tf  : 5 ms

Vtest = 6.0 V

VCCQ  = 5.5 V

Itrigger  = -120 mA

All

5.5 V

2

200

mA