TA8LE III. Group A inspection for device type 53 - Continued.
Symbol |
MIL- STD- 883 method |
Cases A,C,D,T, X,Y |
For terminal conditions, see 1/ |
Measured terminal |
Test limits |
Unit |
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1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
Subgroup 9 TA = 25°C |
Subgroup 10 TA = 125°C |
Subgroup 11 TA = -55°C |
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Test no. |
2A |
28 |
1A |
18 |
1C |
1Y |
VSS |
2C |
2Y |
3Y |
3A |
38 |
3C |
VDD |
Min |
Max |
Min |
Max |
Min |
Max |
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tPLH " " " " " " " " |
3003 Fig. 3 " " " " " " " |
133 134 135 136 137 138 139 140 141 |
IN 5.0V " " " " " " " |
5.0V IN 5.0V " " " " " " |
5.0V " " IN 5.0V " " " " |
5.0V " " " IN 5.0V " " " |
5.0V " " " " IN 5.0V " " |
OUT " " |
GND " " " " " " " " |
5.0V " IN 5.0V " " " " " |
OUT " " |
OUT " " |
5.0V " " " " " IN 5.0V " |
5.0V " " " " " " IN 5.0V |
5.0V " " " " " " " IN |
5.0V " " " " " " " " |
2A to 2Y 28 to 2Y 2C to 2Y 1A to 1Y 18 to 1Y 1C to 1Y 3A to 3Y 38 to 3Y 3C to 3Y |
13 " " " " " " " " |
150 " " " " " " " " |
18 " " " " " " " " |
225 " " " " " " " " |
13 " " " " " " " " |
150 " " " " " " " " |
ns " " " " " " " " |
tTHL " " " " " " " " |
3004 Fig. 3 " " " " " " " |
142 143 144 145 146 147 148 149 150 |
IN 5.0V " " " " " " " |
" IN 5.0V " " " " " " |
" " " IN 5.0V " " " " |
" " " " IN 5.0V " " " |
" " " " " IN 5.0V " " |
OUT " " |
" " " " " " " " " |
" " IN 5.0V " " " " " |
OUT " " |
OUT " " |
" " " " " " IN 5.0V " |
" " " " " " " IN 5.0V |
5.0V " " " " " " " IN |
" " " " " " " " " |
2Y 2Y 2Y 1Y 1Y 1Y 3Y 3Y 3Y |
13 " " " " " " " " |
250 " " " " " " " " |
18 " " " " " " " " |
375 " " " " " " " " |
13 " " " " " " " " |
250 " " " " " " " " |
" " " " " " " " " |
tTLH " " " " " " " " |
3004 Fig. 3 " " " " " " " |
151 152 153 154 155 156 157 158 159 |
IN 5.0V " " " " " " " |
" IN 5.0V " " " " " " |
" " " IN 5.0V " " " " |
" " " " IN 5.0V " " " |
" " " " " IN 5.0V " " |
OUT " " |
" " " " " " " " " |
" " IN 5.0V " " " " " |
OUT " " |
OUT " " |
" " " " " " IN 5.0V " |
" " " " " " " IN 5.0V |
5.0V " " " " " " " IN |
" " " " " " " " " |
2Y 2Y 2Y 1Y 1Y 1Y 3Y 3Y 3Y |
13 " " " " " " " " |
300 " " " " " " " " |
18 " " " " " " " " |
450 " " " " " " " " |
13 " " " " " " " " |
300 " " " " " " " " |
" " " " " " " " " |
1/ Pins not designated may be high level logic, low level logic, or open. Exceptions are as follows:
a. VIC(pos) tests, the VSS terminal shall be open. b. VIC(neg) tests, the VDD terminal shall be open. c. ISS tests, the output terminal shall be open.
2/ The device manufacturer may, at his option, measure IIL and IIH at 25°C for each individual input or measure all inputs together.
3/ See 4.4.1c.
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