MIL-M-38510-4 Microcircuits, Digital Ttl, Multiple Nor Gates, Monolithic SiliconThis specification covers the detail requirements for monolithic, silicon, TTL, positive NOR logic gating microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13 - 14 - 15 - 16 - 17 - 18 - 19 - 20 - 21 - 22 - 23 - 24 - 25 - 26 - 27 - 28 - 29 - 30

MIL-M-38510/40

FIGURE 8.   Base emitter voltage test circuit for device type 02.

NOTE:

At the manufacturer's option, the expander test current limit may be verified by the use of an alternate equivalent procedure.  The VX voltage source and the IX meter may be replaced with a 110  ±1% resistor in

parallel with a voltmeter between pins 1 and 15 ( X to X ).  When the applicable conditions are applied, the

resultant voltage drop across the resistor is measured.  The IX limit of 3.5 mA is met if the resultant voltage does not exceed 0.4 V.

FIGURE 9.   Expander current test circuit for device type 02.

16

For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business