MIL-M-38510-4 Microcircuits, Digital Ttl, Multiple Nor Gates, Monolithic SiliconThis specification covers the detail requirements for monolithic, silicon, TTL, positive NOR logic gating microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

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MIL-M-38510140

TABLE I. Electrical performance characteristics - Continued.

Test	Symbol	Conditions -55°C ≤ TC ≤ +125°C unless otherwise specified	0evice type	Limits
Low-level supply current per gate	ICCL	VCC = 5.5 V, VIN = 5 V	01		6.5	mA
			02, 03		9.5	mA
			04		8.5	mA
Input clamp voltage	VI C	VCC = 4.5 V, IIN = -12 mA, TC = 25° C	All		-1.5	V
Propagation delay time high-to-low level	tPHL	CL = 50 pF minimum, RL = 390 n ±5 percent	All	3	24	ns
Propagation delay time low-to-high level	tPLH	CL = 50 pF minimum, RL = 390 n ±5 percent	01, 03, 04	3	27	ns
Propagation delay time low-to-high level	tPLH	CL = 50 pF minimum, RL = 390 n ±5 percent	02	3	30	ns

11 See test figure 7.

21 All unspecified inputs grounded.

31 See test figure 6.

41 See test figure 9.

51 See test figure 8.

61 All unspecified inputs at 5.5 V.

71 Not more than one output should be shorted at a time.