TABLE III. Group A inspection for device type 02 - Continued.
Terminal conditions (pins not designated may be high � 2.0 V, low s 0.7 V, or open).
MIL- |
Cases E, F |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
15 |
16 |
Measured terminal |
Limits |
Unit |
|||
Subgroup |
Symbol |
STD-883 method - |
Case 2 |
2 |
3 |
4 |
5 |
7 |
8 |
9 |
10 |
12 |
13 |
14 |
15 |
17 |
18 |
19 |
20 |
||||
Test no. |
A1 |
B1 |
CLR1 |
Q1 |
Q2 |
Cext2 |
Rext2 |
GND |
A2 |
B2 |
CLR2 |
Q2 |
Q1 |
Cext1 |
Rext1 |
VCC |
Min |
Max |
|||||
9 Tc = 25°C |
tP5 |
3003 Fig. 4 " " " |
98 |
OUT |
J |
J |
GND |
IN |
5.0 V |
5.0 V |
5.0 V |
Q2 |
5.7 |
8.0 |
ms |
||||||||
99 |
IN |
5.0 V |
5.0 V |
" |
OUT |
J |
J |
" |
Q1 |
" |
" |
" |
|||||||||||
100 |
IN |
5.0 V |
" |
OUT |
" |
" |
" |
" |
Q1 |
" |
" |
" |
|||||||||||
101 |
GND |
IN |
" |
OUT |
" |
" |
" |
" |
Q1 |
" |
|||||||||||||
102 |
GND |
IN |
" |
" |
OUT |
" |
" |
" |
Q1 |
" |
" |
" |
|||||||||||
10 |
Same tests and terminal conditions as subgroup 9, except TC = +125°C and limits are as follows: tPLH1 is 5 to 113 ns; tPLH2 is 5 to 90 ns; tPLH3 is 5 to 105 ns; tPHL1 is 5 to 128 ns; tPHL2 is 5 to 105 ns; tPHL3 is 5 to 90 ns; tP1 is 20 to 91 ns; tP2 is 70 to 195 ns; tP3 is 600 to 850 ns; and tP5 is 5.5 to 8.5 ms. |
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11 |
Same tests and terminal conditions as for subgroup 10, except TC = -55°C |
NOTES:
A. VIN = 3.0 V minimum. B. VIN = 0.0 V or GND.
C. Apply input pulse
┌────┐ - - - 2.5 V min/5.5 V max.
──┘ └── 0 V
D. Test numbers 39 through 58 shall be run in sequence. E. Output voltages shall be either:
H > 1.5 V; L < 1.5 V
F. Rext = 1.4 kn minimum to 70 kn maximum, connected to VCC; Cext s 1,000 µF, connected to Rext terminal. G. Rext = 2 kn ±10%, connected to VCC; Cext = 80 pF ±10%, connected to Rext terminal.
I. Rext = 10 kn ±10%, connect to VCC; Cext = 100 pF ±10%, connected to Rext terminal.
J. Rext = 10 kn ±10%, connect to VCC; Cext = 1.0 µF ±10%, connected to Rext terminal. K. Rext = 2 kn ±10%, connect to VCC.
L. Note F may apply during subgroups 1, 2, and 3 testing if desired.
M. During subgroups 9, 10, 11 testing, Rext and Cext may remain applied on the side of the device not under test if desired. N. Rext = 10 kn ±10%, connect to VCC; Cext � 45 pF connected to Rext terminal.
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