MIL-M-38510-314 Microcircuits, Digital, Low-Power Schottky, Ttl, Monostable Multivibrators, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, low-power Schottky TTL, monostable multivibrator microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13 - 14 - 15 - 16 - 17 - 18 - 19 - 20 - 21 - 22 - 23 - 24 - 25 - 26 - 27 - 28 - 29 - 30 - 31 - 32

MIL-M-38510/314C

TABLE I. Electrical performance characteristics - Continued.

Test	Symbol	Conditions -55°C ≤ TC ≤ +125°C unless otherwise specified	Device types	Limits		Unit
Test	Symbol	Conditions -55°C ≤ TC ≤ +125°C unless otherwise specified	Device types	Min	Max	Unit
Propagation delay time high to low level from input B	tPHL2	VCC = 5.0 V CL = 50 pF ± 10% RL = 2kn ± 5% Cext = 1/ Rext = 1/	01, 03	5	92	ns
Propagation delay time high to low level from input B	tPHL2		02	5	105	ns
Propagation delay time high to low level from clear	tPHL3		01, 03	5	48	ns
Propagation delay time high to low level from clear	tPHL3		02	5	90	ns
Minimum pulse width of Q output	tP(MIN)	VCC = 5.0 V CL = 50 pF ± 10% RL = 2kn ± 5% Cext = 2/ ±10% Rext = 2/ ±10%	01, 03		308	ns
Width of Q output pulse	tP1		02	20	91
	tP2		02	70	195
	tP3		02	600	850
	tP4		01, 03	3.0	6.25	µs
	tP5		02	5.5	8.5	ms

1/ For propagation delay tests, see table III for Cext and Rext values.

2/ tP(MIN) test, Cext = open and Rext = 5 kn. tP1 test, Cext = open and Rext = 2 kn.

tP2 test, Cext = 80 pF and Rext = 2 kn.

tP3 test, Cext = 100 pF and Rext = 10 kn. tP4 test, Cext = 1,000 pF and Rext = 10 kn. tP5 test, Cext = 1µF and Rext = 10 kn.