TABLE III. Group A inspection for device type 01 - Continued. 1/
Subgroup |
Symbol |
MIL- STD- 883 method |
Cases A,B,D |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
Measured terminal |
Test limits |
Unit |
|
Case C |
9 |
12 |
13 |
14 |
2 |
1 |
3 |
4 |
5 |
6 |
7 |
8 |
10 |
11 |
Min |
Max |
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Test no. |
R1 |
Clock |
Preset |
VCC |
Clear |
NC |
S1 |
S2 |
S3 |
Q |
GND |
Q |
R2 |
R3 |
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10 TC=+125°C |
fMAX 5/ fMAX 5/ |
(Fig. 5) |
70 71 |
D " |
IN IN |
5.0 V 5.0 V |
5.0 V " |
B B |
C " |
2.4 V " |
2.4 V " |
OUT |
GND " |
OUT |
2.4 V " |
2.4 V " |
Q Q |
3 3 |
MHz MHz |
||
tPLH " " " tPHL " " " tPLH " " " tPHL " " " |
3003 (Fig. 4) |
*72 CKT A *72 CKT B *73 CKT A *73 CKT B 74 CKT A 74 CKT B 75 CKT A 75 CKT B 76 CKT A 76 CKT B 77 CKT A 77 CKT B 78 CKT A 78 CKT B 79 CKT A 79 CKT B |
" " " " " " " " " " " " " " " " |
2.4 V " " " GND " " " IN " " " " " " " |
J J IN IN J J IN IN J J 5.0 V 5.0 V J J 5.0 V 5.0 V |
" " " " " " " " " " " " " " " " |
IN IN J J IN IN J J 5.0 V 5.0 V J J 5.0 V 5.0 V J J |
" " " " " " " " " " " " " " " " |
" " " " " " " " " " " " " " " " |
" " " " " " " " " " " " " " " " |
OUT OUT OUT " " " OUT OUT |
" " " " " " " " " " " " " " " " |
OUT " " " OUT " " " |
" " " " " " " " " " " " " " " " |
" " " " " " " " " " " " " " " " |
Clear/Q Clear/Q Preset/Q Preset/Q Clear/Q Clear/Q_ Preset/Q Preset/Q Clock/Q Clock/Q Clock/Q Clock/Q Clock/Q Clock/Q Clock/Q Clock/Q |
10 " " " " " " " " " " " " " " " |
125 65 125 65 250 100 250 100 125 65 125 65 200 85 200 85 |
ns " " " " " " " " " " " " " " " |
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3003 (Fig. 5) |
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11 |
Same tests, terminal conditions, and limits as for subgroup 10, except TC= -55°C. |
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NOTE: A = normal clock pulse, B = momentary GND, then 4.5 V.
C = input connected to Q , D = input connected to Q.
J = input pulse tp � 100 ns, PRR = 0.5 MHz, VOL = 0 V, VOH = 4.5 V.
1/ Terminal conditions (pins not designated may be H � 2.0 V, or L ≤ 0.8 V, or open).
2/ Tests shall be performed in sequence.
3/ Input voltages shown are: A = 2.4 V minimum and B = 0.4 V maximum.
4/ Output voltages shall be either: (a) H = 2.4 V, minimum and L - 0.4 V, maximum when using a high speed checker double comparator; or (b) H � 1.5 V and L ≤ 1.5 V when using a high speed checker single comparator.
5/ fMAX, minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
* These tests are performed at device manufacturer's option.
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