MIL-M-38510/204F
TABLE I. Electrical performance characteristics.
Test |
Symbol |
Conditions 1/ -55°C ≤ TC ≤ +125°C unless other wise specified |
Device type |
Limits |
Units |
|
Min |
Max |
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High-level output voltage |
VOH |
VCC = 4.5 V, IOH = -2 mA, VIL = 0.8 V, VIH = 2.0 V |
02, 04 |
2.4 |
V |
|
Low-level output voltage |
VOL |
VCC = 4.5 V, IOL = 16 mA, VIL = 0.8 V, VIH = 2.0 V |
01, 02, 03, 04 |
0.5 |
V |
|
Input clamp voltage |
VIC |
VCC = 4.5 V; IIN= -10 mA, TC = +25°C |
01, 02, 03, 04 |
-1.5 |
V |
|
Maximum collector cut-off current |
ICEX |
VCC = 5.5 V, VO = 5.2 V |
01, 03 |
100 |
∝A |
|
High impedance (off-state) output high current |
IOHZ |
VCC = 5.5 V, VO = 5.2 V |
02, 04 |
100 |
∝A |
|
High impedance (off-state) output low current |
IOLZ |
VCC = 5.5 V, VO = 0.5 V |
02, 04 |
-100 |
∝A |
|
High level input current |
IIH1 |
VCC = 5.5 V, VIN = 5.5 V |
01, 02, 03, 04 |
50 |
∝A |
|
IIH2 |
VCC = 5.5 V, VIN = 4.5 V , special programming pin |
100 |
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Low level input current |
IIL |
VCC = 5.5 V, VIN = 0.5 V |
01, 02, 03, 04 |
-1.0 |
-250 |
∝A |
Short circuit output current |
IOS |
VCC = 5.5 V, 2/ VO = 0.0 V |
02, 04 |
-10 |
-100 |
mA |
Supply current |
ICC |
VCC = 5.5 V, VIN = 0 V, outputs = open |
01, 02, 03, 04 |
140 |
mA |
|
Propagation delay time, high to low level logic, address to output |
tPHL1 |
VCC = 4.5 V and 5.5 V, CL = 30 pF, see figure 4 |
01, 02 |
85 |
ns |
|
03, 04 |
35 |
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Propagation delay time, low to high level logic, address to output |
tPLH1 |
VCC = 4.5 V and 5.5 V, CL = 30 pF, see figure 4 |
01, 02 |
85 |
ns |
|
03, 04 |
35 |
|||||
Propagation delay time, high to low level logic, enable to output |
tPHL2 |
VCC = 4.5 V and 5.5 V, CL = 30 pF, see figure 4 |
01, 02 |
40 |
ns |
|
03, 04 |
20 |
|||||
Propagation delay time, low to high level logic, enable to output |
tPLH2 |
VCC = 4.5 V and 5.5 V, CL = 30 pF, see figure 4 |
01, 02 |
40 |
ns |
|
03, 04 |
20 |
1/ Complete terminal conditions shall be specified in table III.
2/ Not more than one output shall be grounded at one time. Output shall be at high logic level prior to test.
4
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