TABLE III. Group A inspection for device type 02 - Continued.
Symbol |
MIL- STD-833 method |
Case A,C,D,T,X,Y |
Terminal conditions 11 |
Measured terminal |
Test limits |
Unit |
||||||||||||||||||
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
Subgroup 12 TA = 25°C |
||||||||||
Symbol |
A |
B |
J |
NC |
E |
F |
VSS |
G |
H |
I |
EN |
C |
D |
VDD |
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Test No. |
Min |
Max |
Min |
Max |
Min |
Max |
||||||||||||||||||
tTLH " " " " " " " " " |
3004 Fig. 3 " " " " " " " " |
176 177 178 179 180 181 182 183 184 185 |
GND IN 10.0V GND " " " " " " |
GND 10.0V IN GND " " " " " " |
OUT " " " " " ‘ " " " |
GND " " " " IN 10.0V GND GND GND |
GND " " " " 10.0V IN GND GND GND |
GND " " " " " " " " " |
GND " " " " " " IN 10.0V GND |
GND " " " " " " 10.0V IN GND |
IN GND " " " " " " " " |
10.0V " " " " " " " GND IN |
GND GND GND IN 10.0V GND " " " " |
GND GND GND 10.0V IN GND " " " " |
10.0V " " " " " " " " " |
J " " " " " " " " " |
5 " " " " " " " " " |
100 " " " " " " " " " |
ns " " " " " " " " " |
|||||
11 Pins not designated may be "HIGH" level logic, "LOW" level logic or open. Exceptions are as follows: VIC(pos) tests, the VSS terminals shall be open; VIC(neg) tests, the VDD terminal shall be open; ISS tests, the output terminals shall be open.
21 The ISS measurements shall be performed in sequence.
31 The device manufacturer may, at his option, measure IIL and IIH at 25°C for each individual input or measure all inputs together.
41 See 4.4.1c
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