TA8LE III. Group A inspection for device type 01 - Continued.
Symbol |
MIL- STD-833 method |
Case A,C,D,T,X,Y |
Terminal conditions 11 |
Measured terminal |
Test limits |
Unit |
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1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
Subgroup 12 TA = 25°C |
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Symbol |
1A |
18 |
1E |
2E |
2A |
28 |
VSS |
2C |
2D |
1I |
2I |
1C |
1D |
VDD |
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Test No. |
Min |
Max |
Min |
Max |
Min |
Max |
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tPLH " " " " " " " " " |
3003 Fig. 3 " " " " " " " " |
180 181 182 183 184 185 186 187 188 189 |
GND IN 10.0V GND " " " " " " |
GND 10.0V IN GND " " " " " " |
OUT " " " " |
OUT " " " " |
GND " " " " " IN 10.0V GND " |
GND " " " " " 10.0V IN GND " |
GND " " " " " " " " " |
GND " " " " " " " IN 10.0V |
GND " " " " " " " 10.0V IN |
IN GND " " " " " " " " |
GND " " " " IN GND " " " |
GND GND GND IN 10.0V GND " " " " |
GND GND GND 10.0V IN GND " " " " |
10.0V " " " " " " " " " |
1I to 1E 1A to 1E 18 to 1E 1C to 1E 1D to 1E 2I to 2E 2A to 2E 28 to 2E 2C to 2E 2D to 2E |
10 13 " " " 10 13 " " " |
200 250 " " " 200 250 " " " |
ns " " " " " " " " " |
|||||
tTHL " " " " " " " " " |
3004 Fig. 3 " " " " " " " " |
190 191 192 193 194 195 196 197 198 199 |
" IN 10.0V GND 10.0V " " " " " |
" 10.0V IN GND " " " " " " |
OUT " " " " |
OUT " " " " |
" " " " " " IN 10.0V GND " |
" " " " " " 10.0V IN GND " |
" " " " " " " " " " |
GND " " " " " " " IN 10.0V |
GND " " " " " " " 10.0V IN |
IN GND " " " " " " " " |
" " " " " IN GND " " " |
" " " IN 10.0V GND " " " " |
" " " 10.0V IN GND " " " " |
" " " " " " " " " " |
1E " " " " 2E " " " " |
5 " " " " " " " " " |
100 " " " " " " " " " |
" " " " " " " " " " |
|||||
tTLH " " " " " " " " " |
" " " " " " " " " " |
200 201 202 203 204 205 206 207 208 209 |
" IN 10.0V GND " " " " " " |
" 10.0V IN GND " " " " " " |
OUT " " " " |
OUT " " " " |
" " " " " " IN 10.0V GND GND |
" " " " " " 10.0V IN GND GND |
" " " " " " " " " " |
GND " " " " " " " IN 10.0V |
GND " " " " " " " 10.0V IN |
IN GND " " " " " " " " |
" " " " " IN GND " " " |
" " " IN 10.0V GND " " " " |
" " " 10.0V IN GND " " " " |
" " " " " " " " " " |
1E " " " " 2E " " " " |
" " " " " " " " " " |
" " " " " " " " " " |
" " " " " " " " " " |
11 Pins not designated may be "HIGH" level logic, "LOW" level logic or open. Exceptions are as follows: VIC(pos) tests, the VSS terminals shall be open; VIC(neg) tests, the VDD terminal shall be open; ISS tests, the output terminals shall be open.
21 The ISS measurements shall be performed in sequence.
31 The device manufacturer may, at his option, measure IIL and IIH at 25°C for each individual input or measure all inputs together.
41 See 4.4.1c.
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