MIL-M-38510/122C
4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with
MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows:
a. Tests shall be as specified in table II herein. b. Subgroups 9, 10, and 11 shall be omitted.
c. Subgroup 12 shall be added to group A inspection for as specified in table III herein. Subgroup 12 shall be performed for initial qualification and after major process or design changes using a sample of 15 devices with no failure allowed.
d. The acceptable sample number for subgroup 13 should be 32 devices with 0 failures. If the input offset voltage and current temperature sensitivities (computed from group A, subgroups 1, 2, and 3 data) indicate a failure (one device) out of an acceptable sample number of 32 devices for subgroup 13,
the lot should be 100 percent electrically retested for the parameters in subgroup 13, and all temperature sensitive rejects should be removed. No re-sampling of the lot is required if the original sample passed the other group A tests.
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows:
a. End point electrical parameters shall be as specified in table II herein. Delta limits shall apply for class S
devices.
b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883.
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End point electrical parameters shall be as specified in table II herein.
4.5 Methods of inspection. Methods of inspection shall be specified in the appropriate tables. Electrical test circuits as prescribed herein or in the referenced test methods of MIL-STD-883 shall be acceptable. Other test circuits shall require the approval of the qualifying activity.
4.5.1 Voltage and current. All voltage values given, except the input offset voltage (or differential voltage) are referenced to the external zero reference level of the supply voltage. Currents given are conventional current and positive when flowing into the referenced terminal.
4.5.2 Life test cooldown procedure. When devices are measured at +25°C following application of the steady- state life or burn-in test condition, they shall be cooled to within +10°C of their power stable condition at room temperature prior to removal of the bias.
4.6 Inspection of packaging. Inspection of packaging shall be in accordance with MIL-PRF-38535.
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