MIL-M-38510/122C
2.3 Order of precedence. In the event of a conflict between the text of this specification and the references cited herein the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained.
3. REQUIREMENTS
3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before contract award (see 4.3 and 6.4).
3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein.
3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein.
3.3.1 Terminal connections. The terminal connections shall be as specified on figure 1.
3.3.2 Schematic circuits. The schematic circuits shall be maintained by the manufacturer and made available to the qualifying activity and the preparing activity upon request.
3.3.3 Case outlines. The case outlines shall be as specified in 1.2.3.
3.4 Lead material and finish. The lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6).
3.5 Electrical performance characteristics. The electrical performance characteristics are as specified in table I, and apply over the full recommended ambient operating temperature range -55°C to +125°C and for supply voltages of ±15 V dc, unless otherwise specified (see table I).
3.5.1 Offset null circuits. Each amplifier having nulling inputs shall be capable of being nulled 1 mV beyond
0.0 volt at -55°C � TA � 125°C using the circuit of figure 2.
3.5.2 Frequency compensation. Device types 01, 02, 04, 05, and 08 shall be free of oscillation when operated in a unity gain noninverting mode with no external compensation and a source resistance of � 10 kn, and when operated in any test condition specified herein. Device type 03 shall be free of oscillation when operated in a closed loop gain of 5 or greater with no external compensation. Device type 07 shall be free of oscillation when operated in a closed loop gain of 3 or greater with no external compensation.
3.5.3 Output short circuit current test. Output short circuit current test (IOS) shall not be performed on any device types. Current density requirements of MIL-PRF-38535, junction temperature (TJ) or both are exceeded under output
short circuit conditions.
3.6 Electrical test requirements. Electrical test requirements for each device class shall be the subgroups specified in table II. The subgroups of table II which constitute the minimum electrical test requirements for screening, qualification, and quality conformance by device class are specified in table II.
3.7 Marking. Marking shall be in accordance with MIL-PRF-38535.
Special marking for device classes B and S. The date code may be reduced to 3 digits (for example, 026 where 0 is the last digit of the year and 26 is the seal week) for device classes B and S.
3.7.1 Serialization. All class S devices shall be serialized in accordance with MIL-PRF-38535.
3.7.2 Correctness of indexing and marking. All devices shall be subjected to the final electrical tests specified in table II after part marking to verify that they are correctly indexed and identified by PIN. Optionally, an approved electrical test may be devised especially for this requirement.
3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number 49 (see MIL-PRF-38535, appendix A).
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