MIL-M-38510-114 Microcircuits, Linear, Bi-Fet Operational Amplifiers, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, BI-FET operational amplifier microcircuit. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

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MIL-M-38510/114B

4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535.

4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with

MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).

4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows:

a. Tests shall be as specified in table II herein. b. Subgroups 9, 10, and 11 shall be omitted.

c. Subgroup 12 shall be added to group A inspection for class S devices only as shown in table III herein.

The sample size series number for subgroup 12 shall be 5.

4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535.

4.4.3 Group C inspection. Group C inspection shall be in accordance with table III of MIL-PRF-38535 and as follows:

a. End point electrical parameters shall be as specified in table II herein. Delta limits shall apply only to subgroup 1 of group C inspection for class B devices.

b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883.

c. Subgroup 3 and 4 shall be added to group C inspection and shall consist of group A, subgroup 8 and 12, as specified in table III herein. The sample size series number for subgroup 3 shall be 10 for class B;

the sample size series number for subgroup 4 shall be 5 for class B.

4.4.4 Group D inspection. Group D inspection shall be in accordance with table IV of MIL-PRF-38535. End point electrical parameters shall be as specified in table II herein.

4.5 Methods of inspection. Methods of inspection shall be specified and as follows.

4.5.1 Voltage and current. All voltage values given, except the input offset voltage (or differential voltage) are referenced to the external zero reference level of the supply voltage. Currents given are conventional current and positive when flowing into the referenced terminal.

4.5.2 Life test cooldown procedure. When devices are measured at +25°C following application of the operating life or burn-in test condition, they shall be cooled to room temperature prior to removal of the bias.