MIL-M-38510-114 Microcircuits, Linear, Bi-Fet Operational Amplifiers, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, BI-FET operational amplifier microcircuit. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13 - 14 - 15 - 16 - 17 - 18 - 19 - 20 - 21 - 22 - 23

MIL-M-38510/114B

1.3 Absolute maximum ratings.

Supply voltage range ....................................................................... ±22 V Input voltage range .......................................................................... ±20 V 1/ Differential input voltage range ......................................................... ±40 V

Storage temperature range .............................................................. -65°C to +150°C Output short-circuit duration ............................................................. Unlimited 2/ Lead temperature (soldering, 60 seconds) ...................................... +300°C.

Junction temperature (TJ) ................................................................ +175°C 3/

1.4 Recommended operating conditions.

Supply voltage range ....................................................................... ±5 V dc to ±20 V dc

Ambient operating temperature range (TA) ...................................... -55°C to +125°C

1.5 Power and thermal characteristics.

Case outlines	Maximum allowable power dissipation	Maximum εJC	Maximum εJA
G	330 mW at TA = +125°C	40°C/W	150°C/W
H	330 mW at TA = +125°C	60°C/W	150°C/W
P	400 mW at TA = +125°C	35°C/W	120°C/W

2. APPLICABLE DOCUMENTS

2.1 Government documents.

2.1.1 Specifications, standards, and handbooks. The following specifications and standards form a part of this specification to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Departments of Defense Index of Specifications and Standards (DODISS) and supplement thereto, cited in the solicitation.

DEPARTMENT OF DEFENSE SPECIFICATIONS

MIL-PRF-38535 - Integrated Circuits (Microcircuits) Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS

MIL-STD-883 - Test Method Standard for Microelectronics.

MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.

(Copies of these documents are available from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.

2.2 Order of precedence. In the event of a conflict between the text of this specification and the references cited herein the text of this document shall takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained.

1/ The absolute maximum negative input voltage is equal to the negative power supply voltage.

2/ Short circuit may be to ground or either supply. Rating applies to +125°C case temperature or +75°C

ambient temperature.

3/ For short term test (in the specific burn-in and life test configuration when required and up to 168 hours

maximum), TJ = 275°C.