MIL-M-38510-105 Microcircuits, Linear, Cmos, High Level Analog Switch With Driver, Monolithic SiliconThis specification covers the detail requirements for silicon, CMOS monolithic, analog switches. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.4.

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TABLE III.  Group A inspection for device types 07, 08 - Continued.

1/   The test circuits used with table III are shown in figure 13, 14, 15, 16, and 17.  The waveforms of figure 8 apply to all device types as specified in table III (see tests for tON and tOFF ).  The waveforms of figure 12 apply to devices 03, 04, and 07 only as specified in table III.

2/   R0S may be measured differentially with respect to VA.  In case of differentially measured voltages, the table III limits representing voltage drop across the tested switch must be maintained.

3/   The input pulse generator shall have the following characteristics:  VGEN = 0-3 V for all device types: rise time / fall time  ≤ 10 ns; PRR = 1 kHz at 50 percent duty cycle.

4/   The input generator shall have the following characteristics:  VGEN = 1 VPP at 1 MHz.

5/   Break-before-make test applies to devices 03, 04, and 07 only.

6/   Conditions for device type 03 only.

7/   Conditions for device type 05 only.

8/   Conditions for device type 06 only.

9/   Conditions for device type 04 only.

10/ Conditions for device type 08 only.

11/ Conditions for device type 07 only.