MIL-M-38510-105 Microcircuits, Linear, Cmos, High Level Analog Switch With Driver, Monolithic SiliconThis specification covers the detail requirements for silicon, CMOS monolithic, analog switches. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.4.

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MIL-M-38510/105A

TABLE II. Electrical test requirements.

MIL-PRF-38535 test requirements

Subgroups (see table III)

Class S

devices

Class B

devices

Interim electrical parameters

Final electrical test parameters

1*, 2, 3, 9

Group A test requirements

1,2,3,(4,7)**,

9,10,11, (12,13,14)***

1,2,3,(4,7)**,

9,10,11, (12,13,14)***

Group B electrical test parameters when using the method 5005 QCI option

1,2,3 and

table IV delta limits

N/A

Group C end-point electrical parameters

1,2,3 and

table IV delta limits

1 and

table IV delta limits

Additional electrical subgroups for group C

periodic inspections

N/A

(4, 7)****

Group D end-point electrical parameters

1,2,3

Additional electrical subgroups for group D

periodic inspections

(4,7)*****

None

*PDA applies to subgroup 1.

** See 4.4.1e

*** See 4.4.1c

**** See 4.4.3c

***** See 4.4.4b

4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535.

4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with

MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).

4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows:

a. Tests shall be as specified in table II herein. b. Subgroups 5, 6, and 8 shall be omitted.

c. Special subgroups shall be added to group A inspection and shall consist of group A subgroups 12, 13, and

14 as specified in table III herein. The sample size series for subgroup 12 shall be 5 with no failures allowed, for all classes. The sample size series for subgroup 13 shall be 7 for all classes. The sample size

series for subgroup 14 shall be 10 for all classes

d. CX measurements shall be made only for initial qualification and after process or design changes which may affect capacitance measurements. Capacitance shall be measured between the designated terminal and

ground at the frequency of 1 MHz. (See method 3012 of MIL-STD-883). CIS and COS tests will be measured with the switch off (see 3.5.1).

e. Subgroups 4 and 7 shall be performed for initial qualification only using a sample of 5 devices for each

device type submitted to group A inspection, with no failure allowed. If not more than 1 failure is found in the first sample of 5, a second sample of 5 is permitted with no further failures allowed.