MIL-M-38510-102 Microcircuits, Linear, Voltage Regulator, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, voltage regulator. Two product assurance classes and a choice of case outlines and lead finish are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

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MIL-M-38510/102C

TABLE II. Electrical test requirements.

MIL-PRF-38535 test requirements	Subgroups (see table III)
MIL-PRF-38535 test requirements	Class S devices	Class B devices
Interim electrical parameters	1	1
Final electrical test parameters 1/	1,2,3	1,2,3
Group A test requirements	1,2,3,4,8A,8B	1,2,3,8A,8B
Group B electrical test parameters when using the method 5005 QCI option	1,2,3, and table IV delta limits	N/A
Group C electrical parameters	1,2,3, and table IV delta limits	1 and table IV delta limits
Additional electrical subgroups for group C periodic inspections	Not applicable	4
Group D end point electrical parameters	1,2,3	1

1/ PDA applies to subgroup 1.

4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End point electrical parameters shall be as specified in table II herein.

4.5 Methods of inspection. Methods of inspection shall be specified and as follows.

4.5.1 Voltage and current. All voltages given are referenced to the microcircuit ground terminal. Currents given are conventional current and positive when flowing into the referenced terminal.

4.5.2 Life test and burn-in cool down procedure. When devices are measured at +25°C following application of the steady state life or burn-in condition, they shall be cooled to within 10°C of their power stable condition at room temperature prior to removal of the bias.