MIL-M-38510-756 Microcircuits, Digital, Advanced Cmos, Flip-Flops, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, advanced CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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Test and MIL-STD-883 test method

Symbol

Test conditions  1/

-55°C ≤ TC  ≤ +125°C

+3.0 v ≤ vCC  ≤ +5.5 v

unless otherwise specified

Device type  2/

vCC

Group A

subgroups

Limits  1/

Unit

Min

Max

Propagation

delay time, CP to

Yn or Yn

3003

tPHL1, tPLH1

4/  5/

14/ 15/

CL  = 50 pF minimum

RL  = 500n

See figure 4

01

3.0 v

9, 11

1.0

13.0

ns

10

1.0

16.0

02

9, 11

1.0

13.5

10

1.0

16.5

03

9, 11

1.0

13.0

ns

10

1.0

15.0

04

9, 11

1.0

13.5

10

1.0

16.5

05

9, 11

1.0

10.0

ns

10

1.0

12.0

06

9, 11

1.0

14.0

10

1.0

16.0

M

01, 03

9

1.0

13.0

02, 04

1.0

13.5

D

01, 03

1.0

13.0

02, 04

1.0

13.5

P, L, R

01, 03

1.0

13.0

02, 04

1.0

13.5

CL  = 50 pF minimum

RL  = 500n

See figure 4

01

4.5 v

9, 11

1.0

10.0

ns

10

1.0

11.5

02

9, 11

1.0

9.5

10

1.0

12.0

03

9, 11

1.0

10.0

ns

10

1.0

11.0

04

9, 11

1.0

9.5

10

1.0

11.5

05

9, 11

1.0

10.0

ns

10

1.0

11.0

06

9, 11

1.0

10.0

10

1.0

11.5

M

01, 03

9

1.0

10.0

02, 04

1.0

9.5

D

01, 03

1.0

10.0

02, 04

1.0

9.5

P, L, R

01, 03

1.0

10.0

02, 04

1.0

9.5