MIL-M-38510-756 Microcircuits, Digital, Advanced Cmos, Flip-Flops, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, advanced CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/7568

TA8LE I. Electrical performance characteristics - Continued.

Test and MIL-STD-883 test method	Symbol	Test conditions 1/ -55°C ≤ TC ≤ +125°C +3.0 V ≤ VCC ≤ +5.5 V unless otherwise specified		Device type 2/	VCC	Group A subgroups	Limits 1/		Unit
							Min	Max
Latch-up supply over-voltage	ICC (O/V2) 11/	tw � 100 µs tcool � tw 5 µs ≤ tr ≤ 5 ms 5 µs ≤ tf ≤ 5 ms Vtest = 6.0 V VCCQ = 5.5 V Vover = 9.0 V		All	5.5 V	2		100	mA
Truth table test output voltage 3014	4/ 5/ 12/	VIH = 2.50 V VIL = 0.45 V Verify output VOUT	M	01, 02, 03, 04	3.0 V	7	L	H
			D				L	H
			P, L, R				L	H
		VIL = 0.60 V, VIH = 3.70 V Verify output VOUT		All	4.5 V	7, 8	L	H
Maximum clock frequency 3003	fMAX 13/	CL = 50 pF minimum RL = 500n See figure 4		01, 03	3.0 V	9, 11	90		MHz
						10	75
				02		9, 11	80
						10	60
				04		9, 11	75
						10	55
				05, 06		9, 11	85
						10	65
		CL = 50 pF minimum RL = 500n See figure 4		01, 03	4.5 V	9, 11	95
						10	90
				02		9, 11	100
						10	95
				04		9, 11	95
						10	80
				05, 06		9, 11	100
						10	85

See footnotes at end of table.