MIL-M-38510/756B
1.4 Recommended operating conditions - Continued. 2/ 3/ 4/
Minimum setup time, OE to CP (ts): Device type: 03 Unit
VCC = 3.0 V dc; TC = +25°C, -55°C ................................................................ |
7.0 |
ns |
TC = +125°C.......................................................................... |
9.5 |
ns |
VCC = 4.5 V dc; TC = +25°C, -55°C ................................................................ |
5.0 |
ns |
TC = +125°C.......................................................................... |
6.0 |
ns |
Minimum hold time, OE from CP (th): Device type: 03 Unit
VCC = 3.0 V dc; TC = +25°C, -55°C ................................................................ |
0.0 |
ns |
TC = +125°C.......................................................................... |
1.0 |
ns |
VCC = 4.5 V dc; TC = +25°C, -55°C ................................................................ |
1.0 |
ns |
TC = +125°C.......................................................................... |
2.0 |
ns |
1.5 Radiation features.
Maximum total dose available (dose rate = 50 - 300 rads (Si)/s):
Device types 01, 02, 03, and 04....................................................................... 100 krads (Si) Single Event Latch-up (SEL) ........................................................................... � 93 MeV-cm2/mg
2. APPLICABLE DOCUMENTS
2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This section does not include documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this specification, whether or not they are listed.
2.2 Government documents.
2.2.1 Specifications and Standards. The following specifications and standards form a part of this specification to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits (Microcircuits) Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.
(Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch/ or https://assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. The maximum junction temperature may be exceeded for allowable short duration burn-in screening conditions in accordance with MIL-PRF-38535.
2/ Unless otherwise noted, all voltages are referenced to GND.
3/ Operation from 2.0 V dc to 3.0 V dc is provided for compatibility with data retention and battery back-up systems. Data retention implies no input transitions and no stored data loss with the following conditions: VIH � 70 percent of VCC, VIL ≤ 30 percent of VCC, VOH � 70 percent of VCC at -20 µA, VOL ≤ 30 percent of VCC at 20 µA.
4/ Unless otherwise specified, the values listed above shall apply over the full VCC and TC recommended operating range.
3
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