MIL-M-38510-55 Microcircuits, Digital, Cmos, Buffer/Converter, True/Compliment Buffer, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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TABLE III.  Group A inspection for device type 55 - Continued.

SS                                                                                                                                           DD

C                                   C                                     C

1/    Input pins not designated may be tied to VDD  (or VCC) or GND or may be left open provided they do not influence the outcome of the measurement.

Output pins not designated may be tied to the loads or may be left open provided they do not influence the outcome of the measurement.

2/    Terminal 16 is not connected for device types 53 and 54.

3/    Test parameter VIC(pos)  does not apply to device types 53 and 54.

4/    When performing quiescent supply current measurements (ISS), the meter shall be placed so that all currents flow through the meter.

5/    The device manufacturer may, at his option, measure IIL  and IIH  at 25°C for each individual input or measure all inputs together.

6/    (A) Capacitance bridge between measured terminal and VSS; frequency = 1 MHz.

7/    Test limits tPHL, tPLH, tTHL, and tTLH for device types 51/53 and 52/54 consists of two sets of values and are expressed XXX/XXXX in the limits column.  The digits preceding the slash apply to the first device in a set.