MIL-M-38510-55 Microcircuits, Digital, Cmos, Buffer/Converter, True/Compliment Buffer, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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1/    Input pins not designated may be tied to VDD  (or VCC) or GND or may be left open provided they do not influence the outcome of the measurement.

Output pins not designated may be tied to the loads or may be left open provided they do not influence the outcome of the measurement.

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3/    Terminal 16 is not connected for device types 03 and 04.

4/    Test parameter VIC(pos)  does not apply to device types 03 and 04.

5/    When performing quiescent supply current measurements (ISS), the meter shall be placed so that all currents flow through the meter.

6/    The device manufacturer may, at his option, measure IIL  and IIH  at 25°C for each individual input or measure all inputs together.

7/    (A) Capacitance bridge between measured terminal and VSS; frequency = 1 MHz.

8/    Test limits tPHL, tPLH, tTHL, and tTLH for device types 01/03 and 02/04 consists of two sets of values and are expressed XXX/XXXX in the limits columns.  The digits preceding the slash apply to the first device in a set.