MIL-M-38510-382 Microcircuits, Digital, Bipolar, Advanced Low Power Schottky Ttl, D-Type Latches, Cascadable, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, advanced low power Schottky TTL, D-type latches, bistable logic microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

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TABLE III. Group A inspection for device type 04 - Continued. Terminal conditions (pins not designated may be high � 2.0 V; low s 0.8 V; or open).

1/ Pins not referenced are N/C.

2/ IIL limits shall be as follows:

Test	Min/Max limits in µA for circuit
Test	A	B	C
IIL	0/-100	0/-100	0/-200

3/ Method 3011 shall be used, except the output voltage shall be as specified herein, and the output current shall be operating rather than short circuit current. The output conditions have been chosen to produce a current that closely approximates one-half of the true short circuit output current IOS.

4/ IO limits for circuit C shall be -70 to -110 mA.

5/ Tests shall be performed in sequence, attributes data only.

6/ Outputs shall be high � 1.5 V; low s 1.5 V.