TA8LE III. Group A inspection for device type 01.
Terminal conditions (pins not designated may be high � 2.0 V; low s 0.8 V; or open).
Subgroup |
Symbol |
MIL-STD- 883 method |
Cases R, S, 2 |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
15 |
16 |
17 |
18 |
19 |
20 |
Measured terminal |
Test limits |
Unit |
|
Test no. |
OC |
1D |
2D |
3D |
4D |
5D |
6D |
7D |
8D |
GND |
ENC |
8Q |
7Q |
6Q |
5Q |
4Q |
3Q |
2Q |
1Q |
VCC |
Min |
Max |
|||||
9 Tc = 25°C |
tPLZ |
3003 Fig. 4 " " " " " " |
149 |
IN |
GND |
GND |
IN |
OUT |
5.0 V |
OC to 1Q |
2 |
15 |
ns |
||||||||||||||
150 |
" |
GND |
" |
" |
OUT |
" |
OC to 2Q |
" |
" |
" |
|||||||||||||||||
151 |
" |
GND |
" |
" |
OUT |
" |
OC to 3Q |
" |
" |
" |
|||||||||||||||||
152 |
" |
GND |
" |
" |
OUT |
" |
OC to 4Q |
" |
" |
" |
|||||||||||||||||
153 |
" |
GND |
" |
" |
OUT |
" |
OC to 5Q |
" |
" |
" |
|||||||||||||||||
154 |
" |
GND |
" |
" |
OUT |
" |
OC to 6Q |
" |
" |
" |
|||||||||||||||||
155 |
" |
GND |
" |
" |
OUT |
" |
OC to 7Q |
" |
" |
" |
|||||||||||||||||
156 |
" |
GND |
" |
" |
OUT |
" |
OC to 8Q |
" |
" |
" |
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10 |
tPLH2 |
Same tes |
ts, termin
nal condit |
al conditions as for subgroup 9, except TC = +125°C. |
8 |
27 |
" |
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tPHL2 |
4 |
20 |
" |
||||||||||||||||||||||||
tPLH3 |
2 |
15 |
" |
||||||||||||||||||||||||
tPHL3 |
2 |
15 |
" |
||||||||||||||||||||||||
tPZH |
4 |
21 |
" |
||||||||||||||||||||||||
tPZL |
4 |
21 |
" |
||||||||||||||||||||||||
tPHZ |
2 |
12 |
" |
||||||||||||||||||||||||
tPLZ |
2 |
18 |
" |
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11 |
Same tests, termi |
ions, and limits as for subgroup 10, except Tc = -55°C. |
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1/ IIL limits shall be as follows:
Test |
Min/Max limits in µA for circuit |
||
A |
8 |
C |
|
IIL |
0/-200 |
0/-100 |
0/-200 |
2/ Method 3011 shall be used, except the output voltage shall be as specified herein, and the output current shall be operating rather than short circuit current. The output conditions have been chosen to produce a current that closely approximates one-half of the true short circuit output current IOS.
3/ IO limits shall be as follows:
Test |
Min/Max limits in µA for circuit |
||
A |
8 |
C |
|
IO |
-20/-112 |
-15/-110 |
-70/-110 |
4/ Tests shall be performed in sequence, attributes data only.
5/ Outputs shall be high � 1.5 V; low s 1.5 V.
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