TA8LE III. Group A inspection for device type 05.
Terminal conditions (pins not designated may be high � 2.0 V; low s 0.8 V; or open).
- - - - 2.5 V min/ 5.5 V max
1/ Apply one clock pulse prior to test as follows: 0 V
2/ IIL limits shall be as follows:
Test |
Min/Max limits in µA for circuit |
||
A |
8 |
C |
|
IIL |
0/-200 |
3/ Method 3011 shall be used, except the output voltage shall be as specified herein, and the output current shall be operating rather than short circuit current. The output conditions have been chosen to produce a current that closely approximates one-half of the true short circuit output current IOS.
4/ Only a summary of attributes data is required.
5/ A = 3.0 V minimum, 8 = 0.0 V or GND.
6/ H > 1.5 V; L < 1.5 V.
7/ The fMAX minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
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