TABLE III. Group A inspection for device type 04.
Terminal conditions (pins not designated may be high � 2.0 V; low s 0.8 V; or open).
1/ Apply 2.0 V min/4.5 V max (pulse, prior to test).
-- 0 V
2/ IIL limits shall be as follows:
Parameters |
Min/Max limits in µA for circuit |
||
A |
B |
C |
|
IIL |
0/-200 |
3/ Method 3011 of MIL-STD-883 shall be used, except the output shall be as specified herein, and the output current shall be operating rather than short circuit current.
The output conditions have been chosen to produce a current that closely approximates one half of the true short circuit output current, IOS.
4/ Tests shall be performed in sequence, attributes data only.
5/ A = 2.4 V, minimum, B = 0.4 V.
6/ X = indeterminate output voltage.
7/ H > 1.5 V, L < 1.5 V.
8/ fMAX minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency.
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