MIL-M-38510/3728
1.3 Absolute maximum ratings.
Supply voltage range ............................................................................. -0.5 V dc to +7.0 V dc
Input voltage range ................................................................................ -1.5 V dc at -18 mA to +7.0 V dc
Storage temperature range .................................................................... -65° to +150°C Maximum power dissipation (PD), per device: 1/
Device 01 ......................................................................................... 104.5 mW
Device 02 ......................................................................................... 77 mW Device 03 ......................................................................................... 148.5 mW
Device 04 ......................................................................................... 170.5 mW
Lead temperature (soldering, 10 seconds) ....................................... +300°C Thermal resistance, junction to case (eJC):
Cases E, F, R, S, and 2 ........................................................................ (See MIL-STD-1835)
Junction temperature (TJ) 2/ ................................................................... 175°C
1.4 Recommended operating conditions.
Supply voltage (VCC) .............................................................................. 4.5 V dc minimum to 5.5 V dc maximum
Minimum high level input voltage (VIH) ................................................... 2.0 V dc
Maximum low level input voltage (VIL) .................................................... 0.8 V dc
Normalized fanout (each output) 3/ ........................................................ 10 maximum at low logic level
20 maximum at high logic level
Case operating temperature range (TC) ................................................. -55° to +125°C Minimum width of clock pulse (tP(CLK))
type 01, 02 25°C ......................................................................... 10 ns
-55/125°C .................................................................. 12.5 ns type 04 25°C ......................................................................... 14 ns
-55/125°C .................................................................. 16.5 ns
Minimum width of clear pulse (tP(CLEAR))
type 01, 02 ....................................................................................... 15 ns
Minimum width of enable pulse (tP(ENA8LE))
type 03 ............................................................................................. 10 ns
Minimum setup time before clock (tSETUP)
type 01, 02 ....................................................................................... 16 ns
type 04 ............................................................................................. 10 ns
Minimum hold time after clock (tHOLD)
type 01, 02 ....................................................................................... 0 ns
type 04 ............................................................................................. 4 ns
Minimum setup time before enable (tSETUP)
type 03 ............................................................................................. 10 ns
Minimum hold time after enable (tHOLD)
type 03 ............................................................................................. 7 ns
Minimum clear inactive state time before clock
type 01, 02 ....................................................................................... 8 ns
1/ Must withstand the added PD due to short-circuit test (e.g., IOS).
2/ Maximum junction temperature should not be exceeded except in accordance with allowable short
duration burn-in screening condition in accordance with MIL-PRF-38535.
3/ The device should fanout in both high and low levels to the specified number of inputs of the same device type as that being tested.
2
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