MIL-M-38510-123 Microcircuits, Linear, Cmos, Negative Logic, Analog Switch, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, CMOS negative logic analog switches. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3

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MIL-M-38510/123B

TABLE II. Electrical test requirements.

MIL-PRF-38535 test requirements

Subgroups (see table III)

Class S

devices

Class B

devices

Interim electrical parameters

Final electrical test parameters

1*, 2, 3, 9

Group A test requirements

1,2,3,4**,

9,10,11, (12,13,14)***

1,2,3,4**,

9,10,11, (12,13,14)***

Group B electrical test parameters when

using the method 5005 QCI option

1,2,3 and

table IV delta limits

N/A

Group C end-point electrical

parameters

1,2,3 and

table IV delta limits

1 and

table IV delta limits

Additional electrical subgroups for group C

periodic inspections

N/A

(12,13,14)****

Group D end-point electrical

parameters

1,2,3,

(12,13,14)*****

* PDA applies to subgroup 1.

** Subgroup 4, see 4.4.1c

*** See 4.4.1d

**** See 4.4.3c

***** See 4.4.4

4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535.

4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with

MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).

4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows:

a. Tests shall be as specified in table II herein. b. Subgroups 5, 6, 7, and 8 shall be omitted.

c. Subgroup 4 (CA, CIS, and COS measurements) shall be measured only for initial qualification and after process or design changes which may affect input capacitance. Capacitance shall be measured between the designated terminal and ground at a frequency of 1 MHz. Subgroup 4 shall be performed using a sample of 5 devices with no failures allowed.

d. Subgroups 12, 13, and 14 shall be added to group A inspection as specified in table III herein. These subgroups shall be performed for initial qualification only using a sample of five devices for each device type submitted to group A inspection, with no failures allowed. If not more than one failure is found in the first sample of five, a second sample of five is permitted with no further failures allowed.

4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535.