TABLE III. Group A inspection for device type 08 -Continued.
Subgroup |
Symbol |
Test no. |
Adapter pin number 1/ |
Relays energized |
Measured pin no. |
Limits |
Unit |
||||||||||||||
1 IN1 |
2 S1 |
3 S3 |
4 S2 |
5 S4 |
6 +VCC |
7 -VCC |
8 GN0 |
9 NC |
10 01 |
11 03 |
12 02 |
13 04 |
14 IN2 |
Min |
Max |
||||||
13 TA =-55°C |
t0 |
193 194 195 196 |
IN IN |
IN IN |
IN IN |
IN IN |
IN IN |
15 V " " " |
-15 V " " " |
GN0 " " " |
IN IN |
K6,K14 K6,K14 K7,K15 K7,K15 |
11 11 12 12 |
15 " " " |
ns " " " |
NOTES:
1/ The test circuits used with table III are shown in figures 15, 16, and 17. The waveforms on figure 10 apply to all device types as specified within table IV (see tests for tON and tOFF). The waveforms in figure 14 apply to device types 02, 04, 06, and 08 as specified within table III.
2/ R0S may be measured differentially with respect to VA. In case of differentially measured voltages, the table III limits representing voltage drop across the tested switch must be maintained.
3/ The input pulse generator shall have the following characteristics: (a) VGEN = 0-4 V for devices 01-04; VGEN = 0-15 V for devices 05-08; Rise time/fall time
σ 20 ns; PRR = 1 kHz at 50 percent duty cycle, or single step changing device from "ON" state to "OFF" state (rise time/fall time σ 20 ns).
4/ The input generator shall have the following characteristics: VGEN = 1 VP-P at 1 MHz.
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