MIL-M-38510/109B
TABLE I. Electrical performance characteristics - Continued.
Test |
Symbol |
Conditions -55°C s TA s +125°C unless otherwise specified see figure 3 |
Device type |
Limits 1/ |
Unit |
|
Min |
Max |
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Temperature coefficient of capacitor charge time (astable) |
tch / dT |
VCC = 16.5 V dc, RTA = RTB = 1 kn, CT = 0.1 µF, see figure 6 |
01,03 |
-68 |
68 |
ns / °C |
VCC = 15.0 V dc, RTA = RTB = 1 kn, CT = 0.1 µF, see figure 6 |
02 |
-68 |
68 |
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Reset time |
tres |
VCC = 16.5 V dc, see figure 7, -55°C s TA s +25°C |
01,03 |
1.5 |
µs |
|
VCC = 15.0 V dc, see figure 7, -55°C s TA s +25°C |
02 |
1.5 |
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VCC = 16.5 V dc, see figure 7, TA = +125°C |
01,03 |
2 |
||||
VCC = 15.0 V dc, see figure 7, TA = +125°C |
02 |
2 |
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Matching, time delay, output high (monostable) |
dtD(OH)M 3/ |
5 V dc s VCC s 15 V dc, 2/ RT = 1 kn, CT = 0.1 µF, TA = +25°C, see figure 4 |
02 |
-1.1 |
+1.1 |
µs |
Matching, temperature coefficient of time delay (monostable) |
dtD(OH)M/ dT 4/ |
VCC = 15 V dc, 2/ RT = 1 kn, CT = 0.1 µF, see figure 4 |
02 |
-20 |
+20 |
ns/°C |
Matching, drift in time delay versus supply voltage (monostable) |
dtD(OH)M/ dVCC 5/ |
dVCC = 10 V dc, 2/ RT = 1 kn, CT = 0.1 µF, TA = +25°C, see figure 4 |
02 |
-110 |
+110 |
ns/V |
1/ Limits apply to both device types unless otherwise specified. Each side of device type 02 shall be tested separately.
2/ Device type 02 only - matching between side "A" and side "B".
3/ dtD(OH)M = dtD(OH) side "A" - dtD(OH) side "B".
4/ dtD(OH)M / dT = dtD(OH) / dT side "A" - dtD(OH) / dT side "B".
5/ dtD(OH)M / dVCC = dtD(OH) / dVCC side "A" - dtD(OH) / dVCC side "B".
6/ ISOURCE for device type 03 = -60 mA.
10
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