MIL-M-38510/751B
TABLE I. Electrical performance characteristics - Continued.
3/ This test is guaranteed, if not tested, to the limits specified in table I.
4/ RHA samples do not have to be tested at -55°C and +125°C prior to irradiation.
5/ When performing postirradiation electrical measurements for any RHA level, TA = +25°C. Limits shown are guaranteed at
TA = +25°C ±5°C.
6/ Transmission driving tests are performed at VCC = 5.5 V dc with a 2 ms duration maximum.
7/ Power dissipation capacitance (CPD) determines the no load dynamic power consumption,
PD = (CPD + CL) (VCC x VCC)f + (ICC x VCC) and the dynamic current consumption, IS = (CPD + CL)VCCf + ICC. For both PD and
IS, f is the frequency of the input signal.
8/ This test is for qualification only. Ground bounce tests are performed on a nonswitching (quiescent) output and are used to measure the magnitude of induced noise caused by other simultaneously switching outputs. The test is performed on a low noise bench test fixture with all outputs fully dc loaded (IOL maximum and IOH maximum = i.e., ±24 mA) and 50 pF of load capacitance (see figure 3). The loads must be located as close as possible to the device output. Inputs are then conditioned with 1 MHz pulse (tr = tf = 3.5 ±1.5 ns) switching simultaneously and in phase such that one output is forced low and all others (possible) are switched. The low level ground bounce noise is measured at the quiet output using a F.E.T. oscilloscope probe with at least 1 Mn impedance. Measurement is taken from the peak of the largest positive pulse with respect to the nominal low level output voltage (figure 3). The device inputs are then conditioned such that the output under test is at a high nominal VOH level. The high level ground bounce measurement is then measured from nominal VOH level to the largest negative peak. This procedure is repeated such that all outputs are tested at a high and low level with a maximum number of outputs switching.
9/ See EIA/JEDEC STD. No. 78 for electrically induced latch-up test methods and procedures. The values listed for Itrigger and
Vover are to be accurate within ±5 percent.
10/ Tests shall be performed in sequence, attributes data only. Functional tests shall include the truth table and other logic patterns used for fault detection. Functional tests shall be performed in sequence as approved by the qualifying activity on qualified devices. H � 2.5 V, L < 2.5 V; high inputs = 3.7 V and low inputs = 0.6 V for VCC = 4.5 V and H � 1.5 V,
L < 1.5 V; high inputs = 2.5 V and low inputs = 0.45 V for VCC = 3.0 V. Tests at VCC = 3.0 V are for RHA specified devices only (TA = +25°C ±5°C). Functional tests at VCC = 3.0 V are worst case for RHA specified devices.
11/ Devices are tested at VCC = 3.0 V and VCC = 4.5 V at TC = +125°C for sample testing and at VCC = 3.0 V and VCC = 4.5 V at
TC = +25°C for screening. Other voltages of VCC and temperatures are guaranteed, if not tested. See 4.4.1d.
12/ AC limits at VCC = 5.5 V are equal to the limits at VCC = 4.5 V and guaranteed by testing at VCC = 4.5 V. Minimum ac limits for VCC = 5.5 V are 1.0 ns and guaranteed by guardbanding the VCC = 4.5 V minimum limits to 1.5 ns. For propagation delay tests, all paths must be tested.
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