MIL-M-38510-751 Microcircuits, Digital, Advanced Cmos, Nor Gates, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, advanced CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.0.

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Test and

MIL-STD-883 test method

Symbol

Test Conditions  1/

-55°C s TC  s +125°C

+3.0 V s VCC  s +5.5 V

unless otherwise specified

Device type  2/

VCC

Group A

subgroups

Limits  1/

Unit

Min

Max

Quiescent supply current, output high

3005

ICCH

4/  5/

For all inputs,

VIN  = VCC  or GND

All

5.5 V

1

1.0

µA

2

20.0

M

01

1

15.0

D

75.0

P, L, R

700.0

Quiescent supply

current, output low

3005

ICCL

4/  5/

For all inputs,

VIN  = VCC  or GND

All

5.5 V

1

1.0

µA

2

20.0

M

01

1

15.0

D

75.0

P, L, R

700.0

Low level

ground  bounce noise

VGBL

8/

VLD  = 2.5 V IOL = +24 mA

VIN  = 4.5 V or 0.0 V See figure 3

All

4.5 V

4

0.0

1000

mV

High level

ground  bounce noise

VGBH

8/

VLD  = 2.5 V IOH  = -24 mA

VIN  = 4.5 V or 0.0 V See figure 3

All

4.5 V

4

0.0

1000

mV

Latch-up input/ output over- voltage

ICC

(O/V1)

9/

tw � 100 µs tcool  � tw

5 µs s tr  s 5 ms

5 µs s tf  s 5 ms

Vtest = 6.0 V

VCCQ  = 5.5 V

Vover  = 10.5 V

All

5.5 V

2

200

mA

Latch-up input/ output positive over-current

ICC

(O/I1+)

9/

tw � 100 µs tcool  � tw

5 µs s tr  s 5 ms

5 µs s tf  s 5 ms

Vtest = 6.0 V

VCCQ  = 5.5 V

Itrigger  = +120 mA

All

5.5 V

2

200

mA

Latch-up input/ output negative over-current

ICC

(O/I1-)

9/

tw � 100 µs tcool  � tw

5 µs s tr  s 5 ms

5 µs s tf  s 5 ms Vtest = 6.0 V VCCQ  = 5.5 V

Itrigger  = -120 mA

All

5.5 V

2

200

mA

Latch-up supply over-voltage

ICC

(O/V2)

9/

tw � 100 µs tcool  � tw

5 µs s tr  s 5 ms

5 µs s tf  s 5 ms

Vtest = 6.0 V

VCCQ  = 5.5 V

Vover  = 9.0 V

All

5.5 V

2

100

mA