MIL-M-38510-702 Microcircuits, Linear, Regulating Pulse Width Modulators, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, regulating, pulse width modulator microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3

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MIL-M-38510/702A

TABLE I. Electrical performance characteristics - Continued.

Test	Symbol	Conditions 1/ -55°C ≤ TC ≤ +125°C see figure 3 unless otherwise specified	Device type	Limits		Units
Test	Symbol		Device type	Min	Max	Units
Under voltage lockout section
Start up threshold voltage	VSU		All		8.0	V
Shutdown threshold voltage	VSD		All	6.0		V
Total standby current section
Supply current	IIN	CURR LIM/SS pin = 0.7 V	All		21	mA

1/ Standard test conditions (unless otherwise specified): +VIN = 15 V dc, timing resistance = 10 kn, and timing capacitance = 4,700 pF.

2/ To verify that the PWM latch is resetting properly, the output stage must resume switching after the completion of a PWM LATCH SET command. To minimize the effects of self heating, the test must be completed with the first 50 ms of applied power. The minimum limit shall be equal to 0.49 times the oscillator frequency.

3/ Parameter measured at trip point of latch with V+ERROR AMP = VREF, V-ERROR AMP = 0 V.

4/ Amplifier gain defined as:

G = �VCOMP pin / �V+CURRENT SENSE pin ; �V+CURRENT SENSE pin = 0 to 10 V.

5/ Current into CUR LIM/SS pin guaranteed to latch circuit in shutdown state.

6/ Current into CUR LIM/SS pin guaranteed not to latch circuit in shutdown state.

7/ This parameter only applies to device type 01.

3.6 Electrical test requirements. Electrical test requirements for each device class shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table III.

3.7 Marking. Marking shall be in accordance with MIL-PRF-38535.

3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number 52 (see MIL-PRF-38535, appendix A).