TABLE III. Group A inspection for device type 52 - Continued.
Symbol |
MIL- STD- 883 method |
Cases R,S, 2 |
Terminal conditions 1/ |
Measured terminal |
Test limits |
Unit |
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1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
15 |
16 |
17 |
18 |
19 |
20 |
Subgroup 9 TC = +25°C 10/ |
Subgroup 10 TC = +125°C |
Subgroup 11 TC = -55°C 10/ |
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Test no. |
OE |
Q1 |
D1 |
D2 |
Q2 |
Q3 |
D3 |
D4 |
Q4 |
GND |
CLK |
Q5 |
D5 |
D6 |
Q6 |
Q7 |
D7 |
D8 |
Q8 |
VCC |
Min |
Max |
Min |
Max |
Min |
Max |
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tPZL |
3003 (Fig. 3) |
157 158 159 160 161 162 163 164 |
IN " " " " " " " |
OUT |
GND |
GND |
OUT |
OUT |
GND |
GND |
OUT |
GND " " " " " " " |
OUT |
GND |
GND |
OUT |
OUT |
GND |
GND |
OUT |
4.5V " " " " " " " |
OE to Q1 OE to Q2 OE to Q3 OE to Q4 OE to Q5 OE to Q6 OE to Q7 OE to Q8 |
31 " " " " " " " |
41 " " " " " " " |
31 " " " " " " " |
ns " " " " " " " |
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tPHZ |
165 166 167 168 169 170 171 172 |
" " " " " " " " |
OUT |
4.5V |
4.5V |
OUT |
OUT |
4.5V |
4.5V |
OUT |
" " " " " " " " |
OUT |
4.5V |
4.5V |
OUT |
OUT |
4.5V |
4.5V |
OUT |
" " " " " " " " |
OE to Q1 OE to Q2 OE to Q3 OE to Q4 OE to Q5 OE to Q6 OE to Q7 OE to Q8 |
" " " " " " " " |
" " " " " " " " |
" " " " " " " " |
" " " " " " " " |
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tPLZ |
173 174 175 176 177 178 179 180 |
" " " " " " " " |
OUT |
GND |
GND |
OUT |
OUT |
GND |
GND |
OUT |
" " " " " " " " |
OUT |
GND |
GND |
OUT |
OUT |
GND |
GND |
OUT |
" " " " " " " " |
OE to Q1 OE to Q2 OE to Q3 OE to Q4 OE to Q5 OE to Q6 OE to Q7 OE to Q8 |
" " " " " " " " |
" " " " " " " " |
" " " " " " " " |
" " " " " " " " |
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tTHL |
3004 |
181 182 183 184 185 186 187 188 |
GND " " " " " " " |
OUT |
IN 4.5V " " " " " " |
4.5V IN 4.5V " " " " " |
OUT |
OUT |
4.5V 4.5V IN 4.5V " " " " |
4.5V " " IN 4.5V " " " |
OUT |
" " " " " " " " |
IN " " " " " " " |
OUT |
4.5V " " " IN 4.5V " " |
4.5V " " " " IN 4.5V 4.5V |
OUT |
OUT |
4.5V " " " " " IN 4.5V |
4.5V " " " " " " IN |
OUT |
" " " " " " " " |
Q1 Q2 Q3 Q4 Q5 Q6 Q7 Q8 |
12 " " " " " " " |
16 " " " " " " " |
12 " " " " " " " |
" " " " " " " " |
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tTLH |
189 190 191 192 193 194 195 196 |
" " " " " " " " |
OUT |
IN GND " " " " " " |
GND IN GND " " " " " |
OUT |
OUT |
GND GND IN GND " " " " |
GND " " IN GND " " " |
OUT |
" " " " " " " " |
" " " " " " " " |
OUT |
GND " " " IN GND " " |
GND " " " " IN GND GND |
OUT |
OUT |
GND " " " " " IN GND |
GND " " " " " " IN |
OUT |
" " " " " " " " |
Q1 Q2 Q3 Q4 Q5 Q6 Q7 Q8 |
" " " " " " " " |
" " " " " " " " |
" " " " " " " " |
" " " " " " " " |
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1/ Output pins not designated may be "high" level logic, "low" level logic, or open. Input pins not designated may be "high" level logic or "low" level logic. Exceptions are as follows:
a. VIC(pos) tests, the GND terminal shall be open. b. VIC(neg) tests, the VCC terminal shall be open. c. ICC tests, the output terminal shall be open.
2/ For equipment that does not allow GND pin to be open during test, minimum limit of 0.4 V applies.
3/ Apply a positive going pulse. 2.5 V minimum/5.5 V maximum.
4/ See 4.4.1c.
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