MIL-M-38510-656 Microcircuits, Digital, High-Speed Cmos, Flip-Flops, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, high speed CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/656A

NOTES:

1. CL includes load and test jig capacitance. See data sheets for values.

2. S1 = VCC for tPZL and tPLZ measurements. S1 = GND for tPZH and tPHZ measurements.

3. Waveforms for negative edge sensitive circuits will be inverted, tREM (20 ns).

4. This waveform is applicable to both three-state and open drain switching time measurements.

FIGURE 3. Switching time test circuit and waveforms - Continued.