MIL-M-38510-652 Microcircuits, Digital, High-Speed Cmos, And Gates, Or Gates, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, high speed CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/652B

TABLE III. Group A inspection for device type 04 - Continued.

1/ Input pins not designated shall be high level logic, low level logic, or may be left open provided they do not influence the outcome of the measurement. Output pins not designated shall be tied to the loads or left open provided they do not influence the outcome of the measurement.

Exceptions are as follows:

a. VIC(pos) tests: The GND terminal shall be open. Minimum limit of 0.4 V applies to tests being performed on equipment not capable of opening GND pin during test.

b. VIC(neg) tests: The VCC terminal shall be open. c. ICC tests: The output terminal shall be open.

2/ See 4.4.1c. For all type input terminals (e.g. clock, clear, data, etc.) a minimum of 3 inputs of each per device shall be tested.

3/ See 4.4.1d.

4.5 Methods of inspection. Methods of inspection shall be specified and as follows:

4.5.1 Voltage and current. Unless otherwise specified, all voltages given are referenced to the microcircuit GND

terminal. Currents given are conventional current and positive when flowing into the referenced terminal.

4.5.2 Burn-in and life test cool down procedures. When the burn-in and life tests are completed and prior to removal of bias voltages, the devices under test (DUT) shall be cooled to within 10°C of their power stable condition at room temperature; then, electrical parameter end-point measurements shall be performed.

TABLE IV. Delta limits at 25°C.

Parameter 1/	Device types
	All
ICC		±30 nA

1/ The above parameters shall be recorded before and after the required burn-in and life tests to determine deltas (�).

4.5.3 Quiescent supply current (ICC test). When performing quiescent supply current measurements (ICC), the meter shall be placed so that all currents flow through the meter.

5. PACKAGING

5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the

contract or order (see 6.2). When packaging of materiel is to be performed by DoD or in-house contractor personnel, these personnel need to contact the responsible packaging activity to ascertain packaging requirements. Packaging

requirements are maintained by the Inventory Control Point's packaging activity within the Military Service or Defense

Agency, or within the military service's system commands. Packaging data retrieval is available from the managing Military Department's or Defense Agency's automated packaging files, CD-ROM products, or by contacting the responsible packaging activity.