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MIL-M-38510-651 Microcircuits, Digital, High-Speed Cmos, Nor Gates, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, high speed CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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TA8LE III.  Group A inspection for device type 02 - Continued.


Symbol

MIL- STD-

883

method

Case

Terminal conditions 1/

Measured terminal

Test limits

Unit

2

2

3

4

6

8

9

10

12

13

14

16

18

19

20

3/ Subgroup 9

TC  = +25°C

Subgroup 10

TC  = +125°C

3/ Subgroup 11

TC  = -55°C

C,D

1

2

3

4

5

6

7

8

9

10

11

12

13

14

Test no.

1A

18

2A

28

2C

2Y

GND

3Y

3A

38

3C

1Y

1C

VCC

Min

Max

Min

Max

Min

Max

tPLH

3003 (Fig. 3)

84 to

92

Same terminal conditions and limits as specified above for tPHL.

tTHL

3004 (Fig. 3)

93

94

95

IN

GND

IN

GND

GND

OUT

GND "

"



OUT



IN



GND



GND

OUT

GND

4.5V "

"

1Y

2Y

3Y

3 " "

15 "

"

3 " "

20 "

"

3 " "

15 "

"

ns

" "

tTLH

3004 (Fig. 3)

96 to

98

Same terminal conditions and limits as specified above for tTHL.


See footnotes at end of table.




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